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EVK Helios EQ32

The EVK HELIOS EQ32 is a hyperspectral imaging camera with an integrated classification system. This powerful analysis system is based on non-contact and non-destructive short-wavelength infrared imaging spectroscopy.

The EVK HELIOS system analyses chemical properties of objects and makes distinction of material types not visible to color cameras. The internal processing engine delivers qualitative and quantitative information of material streams e.g. analyte concentrations or material compositions.
The camera convinces as a spatially resolved real-time measurement system with powerful data processing and high-precision signal processing for analytical, industrial applications.

Hyperspectral Camera with Integrated Classification System

EVK HELIOS EQ32, a measuring system specially designed for industrial working conditions, has been created in close cooperation with partners from the mechanical and plant engineering industry.

Due to the stable optomechanical design for real industrial temperature conditions, machine designs and fields of application, as well as data processing and algorithms specially developed for analytics, EVK HELIOS EQ32 enables an optimized analysis directly in the process line.

Value Statements

Integrated Data Analysis

no need for external PC

Hyperspectral Imaging Camera

for in-line operations in real-time

Internal Camera Calibration

optically corrected output data, no external calibration necessary

Interface Standard

GigE Vision and GenICam compliant

Excellent Signal-to-Noise Ratio

SNR of 3.500 at a nominal spatial resolution of 320 pixels

Rugged, Industrial Design

for use in harsh environments

Spatial Resolution in Real-Time

The workflow in which the system is configured, chemometric models are created and transferred with the help of the software EVK SQALAR, is seamless. The evaluation takes place completely in the EVK HELIOS EQ32 system, whereby no external evaluation systems are required. However, a connection to already existing evaluation systems is easily possible via GigE Vision and GenICam. EVK HELIOS EQ32 is equipped with 320 spatial sensor resolution, measures in the wavelength range of 930 – 1700nm and thereby scans with a frame rate of 446Hz full frame.

Customers are supported by the EVK Professional Services team from application development to the fully integrated Helios EQ32 system on-site. EVK thus enables the integration of state-of-the-art real-time analysis systems in the shortest possible time in order to successfully equip processing lines for the future and thus exploit the full potential of the applications.

Technical Details

  • Spectral range in near infrared (NIR) and short-wavelength infrared (SWIR): 930 nm to 1700 nm
  • Scan rate of 446 Hz full spectra (248 spectral bands) up to 3.8 kHz using ROI
  • GigE Vision/ GenICam interface

  • Rugged, industrial design. Protection rating IP54

  • Temperature range 0°C to 50°C with full optical stability

  • System optimized for analytic applications

  • Seamless integration with EVK SQALAR software suite

Do you want to get more information?

Get in touch for more details.
Or visit our Download-Section.

Downloads

EVK HELIOS EQ32 – Product brief

Hyperspectral camera with integrated analysis system

pdf

558.89 KB

EVK HELIOS EQ32 – Data sheet

Hyperspectral camera with integrated analysis system

pdf

574.14 KB

Typical combinations
of our hyperspectral camera system

Supplemented by the EVK SQALAR analysis software, it is possible to efficiently collect data and create chemometric models. The optimized and user-friendly application allows flexible and fast development of applications, minimizing development time and making the process economically effective. The EVK STREAM Supervisor is used for multi-point monitoring of industrial material flows.

In addition, the EVK ABAS inductive metal sensor provides spatially resolved information about conductive material in the product stream and can thus reliably detect ferrous and non-ferrous metal particles and transmit the command to sort them out.

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